Effects of UVC irradiation on alpha-particle track parameters in CR-39

نویسندگان

  • K.C.C. Tse
  • D. Nikezic
  • K. N. Yu
چکیده

The effects of UVC exposure on the track etch rate Vt and the detector sensitivity V of CR-39 SSNTDs were investigated through the diameters and depths of alpha-particle tracks. Both the bulk etch rate Vb and Vt increased but V decreased. The track diameters and depths were used to derive a V function for CR-39 detectors with and without UV irradiation. © 2008 Elsevier Ltd. All rights reserved.

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تاریخ انتشار 2008